• Experimental Station
• Beamline components
• Diffractometer
• Detector systems
• Sample environment

Beamline components

Mirrors
The diffractometer can be operated in the direct synchrotron beam or in a mirrored beam. As an additional option for beam conditioning, two different mirrors are available: a toroidal mirror for high intensity measurements and a cylindrical mirror for high resolution measurements. Toroidal-shaped Au-plated and Pt-coated cylindrical (with a pneumatically adjustable curvature) mirrors are mounted in the line at the distances of 17.5 and 19.5 m from the monochromator, correspondingly, and can be alternatively inserted into the beam path and adjusted independently. Both mirrors are working under specular reflection, and an offset angle of about 0.74 deg. has to be taken into account, which results in a difference of 250 mm in height for the diffractometer with respect to the direct beam (for the last time beamline works as usual in direct mode). The accessible energy range is limited by the absorption edges of the coating materials (λmin = 1.12 A).

Monochromator
The details of a new B2-monochromator can be found on the web-pages of C and A1 beamlines.

Slit systems
Three slit systems can be used for beam conditioning: slit 1 in front of the mirror, slit 2 behind the monochromator and slit 3 near the sample. The primary beam is cut by slit 1 to the size of the monochromating crystals, which reduces the background level. The beam size at the sample position is adjusted by slit 2, and the optimum setting is obtained when the beam covers all of the capillary. Slit 3 cuts off the radiation from the scattering at slit 2. Each slit system has four blades which can be aligned independently.
Between the second and third slit system a NaI scintillation counter is placed at an angle of 90 deg. to the beam. By means of scattering at a foil or from the helium atmosphere in the beam pipe, the incoming intensity can be monitored.