• Experimental Station
• Beamline components
• Diffractometer
• Detector systems
• Sample environment

Detector systems

Two different types of detector are available: a scintillation single counter and an on-site readable position-sensitive image-plate detector (OBI) [M. Knapp et al., NUCL INSTRUM METH A 521 (2004) 565–570]. The user can switch automatically between a one-dimensional position sensitive detector for fast experiments with medium resolution and a scintillation counter with analysing crystal for high resolution and very low background.

The distance from image plate to sample is 345 mm and the spatial resolution of the detector is predominantly defined by the capillary diameter. Typically, a capilary diameter of 0.3 mm is used, which leads to full width at half-maximum of 0.04-0.05 deg. The maximum acceptance angle of the detector is 110 deg. At a wavelength of 0.5-0.7 A, the typical exposure time per pattern is in the range of minutes depending on specific sample.

The single counter consists of a NaI scintillator with embedded photomultiplier and optional slits, parallel foils, Ge (111) (as usual) or Si (111) analyser crystal in front. Typical data collection time at the measurements with scintilation single counter is 12-24 hours per pattern depending on the specific sample and diffractometer setup. In order to save a time, the measurements of only characteristic reflections (not all diffraction pattern) are reasonable in particular cases (see for example H. Kungl et al., ACTA MATER 55 (2007) 1849–1861, L. Vasylechko et al., J SOLID STATE CHEM 178 (2005) 270–278).
Horizontal Soller collimators can optionally be used instead of analyser crystal for experiments with conventional resolution.