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Beamline: F1
Mono- and Polychromatic Single Crystal Diffractometry.
Powder Diffraction and Topography (KAPPA-Diffractometer)
The Kappa-diffractometer (fixed vertical diffraction plane ) with two concentric detector circles is primarily designed for monochromatic (and polychromatic) single crystal diffractometry but also for powder diffraction and topography.
The detector circles are equipped with a standard scintillation counter and a CCD-detector (marresearch, marCCD 165). Optionally, Ge-solid-state detectors (Canberra) for energy dispersive setups are available. On request, further detector arrangements like PSDs in combination with collimators (Soller slits, capillaries, micro channel plates, analyzer crystals) may replace the standard detectors.
Typically, experiments make use of the high intensity, the good collimation, and the tunability over a fairly wide spectral range at this bending magnet beamline.
Standard applications:
- high-precision and fast structural data collections
- low temperature charge-density analysis
- structure determination on micro-crystals
- measurement of weak reflections
- analysis of disorder-induced diffuse scattering
- satellite reflections
- Laue diffraction (CCD)
- anomalous dispersion work
- high-pressure and high-temperature dependent work
Further applications:
- white beam and monochromatic topography
- powder diffraction (monochromatic)
- near edge powder diffraction
- measurement of harmonic reflections simultaneously, energy-scan reflection
- anomalous dispersion effects without monochromator (low energy resolution)
- measurement of fluorescence and Bragg intensity at the same time
- determination of Debye Waller factor from high sin/ reflections
- data collection without scanning, Laue film or imaging plate technique
- imaging of polycrystalline substances
