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The diffractometer was designed such that a sphere of 65 mm radius around its center is free of mechanical components to avoid collisions with the detector system. It resembles a conventional 4-circle diffractometer with 0° < χ < 90° and can thus be used for the investigation of single crystallites and for texture analysis.↵
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It can be applied to study lattice spacing and orientation as function of position in the specimen in order to reveal the influence of the surrounding (strain gradients, grain-grain interactions, etc.) and the impact of processing parameters (crystallization, thermal and mechanical treatment, etc.). The phi-circle of the instrument is equipped with an x,y (300 mm) and z (20 mm) translation allowing the investigation of large workpieces.↵
|
4-Circle Diffractometer |
-90° < 2-θ < 150° |
|---|---|
|
with xyz-Table |
-80 mm < x,y < 120 mm |
|
CCD-Detector |
1000 x 1018 pixel of 12 µm x 12 µm |
|
with Microchannel plate |
thickness 4 mm |
|
NaJ-Detector with Soller slits |
acceptance 0.15° |
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