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Beamline: G3

Materials' Science and Imaging

G3 diffractometer

G3 diffractometer with 2D detector setup

The instrument is used for a novel method that allows imaging using the radiation diffracted by polycrystalline samples (and/or their fluorescence). It applies a micro-channel plate as collimator in front of a position sensitive detector (CCD-camera) such allowing the position resolved detection of radiation from a sample area of more than 1 cm2. The spatial resolution is proportional to the sample to detector distance (currently 12 µm for 12 mm distance).↵

Typical applications are:

  • position resolved diffraction of polycrystalline materials
  • study of dynamic processes like re-crystallization
  • position resolved determination of composition, strain and orientation (texture)

 
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